Webinars

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TEM

FIB

Advanced preparation methods for TEM

High-quality TEM imaging starts long before a sample enters the microscope.

András Szigethy

August 3, 2026 · 74 min

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TEM

FIB

Árpád Barna award winner Kovács András webinar

Join Árpád Barna Award winner and expert microscopist András Kovács for an in-depth look at TEM sample preparation for functional materials.

András Kovács

August 3, 2026 · 65 min

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FIB

Technoorg Linda — TESCAN webinar

Discover the story behind the AURA Gentle Ion Beam (GIB) and the technology that brought it to life.

András Szigethy

August 3, 2026 · 22 min

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Latest Articles

TEM

HRTEM investigation of phase stability in alumina–zirconia multilayer thin films

CHANCHAL GHOSH · April 16, 2015

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TEM

HRTEM investigation of phase stability in alumina–zirconia multilayer thin films

CHANCHAL GHOSH

April 16, 2015

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FIB

SEM

EBSD

An improved FIB sample preparation technique for site-specific plan-view specimens: A new cutting geometry

Chen Li · September 27, 2017

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FIB

SEM

EBSD

An improved FIB sample preparation technique for site-specific plan-view specimens: A new cutting geometry

Chen Li

September 27, 2017

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FIB

EBSD

SEM

In situ observation on formation process of nanoscale cracking during tension-compression fatigue of single crystal copper micron-scale specimen

Takashi Sumigawa · May 1, 2018

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FIB

EBSD

SEM

In situ observation on formation process of nanoscale cracking during tension-compression fatigue of single crystal copper micron-scale specimen

Takashi Sumigawa

May 1, 2018

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EBSD

FIB

Fatigue curve of microscale single-crystal copper: An in situ SEM tension-compression study

Yabin Yan · December 9, 2019

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Zoltán Herceg

Senior Application Specialist

Dr. András Kovács

Senior Researcher at Jülich Forschungszentrum

Márton Iritz

Application Specialist

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